文献类型：期刊文章

作　　者：黄宗卿[1] 张胜涛[1] 谢上芬[1] 陈昌国[1] 杨雨如[1] 朱伟[1]

机构地区：[1]重庆大学应用化学系,重庆400044

出　　处：《电化学》

基　　金：国家自然科学基金

年　　份：1999

卷　　号：5

期　　号：3

起止页码：247-251

语　　种：中文

收录情况：CAS、CSCD、CSCD2011_2012、INSPEC、JST、PUBMED、ZGKJHX、普通刊

摘　　要：Ellipsometric measurements are often extremely sensitive to the presence of very thin surface layers,to changes in their thickness(or coverage),and to changes in surface topography at an atomic scale.These characteristics make the use of ellipsometry for electrochemical studies particularly attractive.The ellipsometric studies on electrochemistry and its applications carried out in the Electrochemical Laboratory of Chongqing University are reviewed briefly: 1)The studies on electrochemistry of classical ellipsometry: 2)The new function V op suggested by the authors. 3)The applications of new approcaches with new function V op suggested by the authors.

关 键 词：电化学 椭圆偏振光谱 研究方法

分 类 号：O646] O657.39[化学类]